89R4891 JRR-D
By: Luther H.B. No. 1946
A BILL TO BE ENTITLED
AN ACT
relating to the denial of certain applications for a permit or other
authorization under the Texas Clean Air Act on the basis of
proximity to a semiconductor wafer manufacturing facility.
BE IT ENACTED BY THE LEGISLATURE OF THE STATE OF TEXAS:
SECTION 1. Subchapter C, Chapter 382, Health and Safety
Code, is amended by adding Section 382.0595 to read as follows:
Sec. 382.0595. DENIAL OF CERTAIN APPLICATIONS FOR PERMIT OR
OTHER AUTHORIZATION ON BASIS OF PROXIMITY TO SEMICONDUCTOR WAFER
MANUFACTURING FACILITY. (a) In this section, "semiconductor wafer
manufacturing facility" means a manufacturing facility that
includes any of the following processes with respect to
semiconductor production:
(1) growing single-crystal ingots or boules;
(2) wafer slicing;
(3) etching and polishing;
(4) bonding;
(5) cleaning;
(6) epitaxial deposition; or
(7) metrology.
(b) Notwithstanding any other law, the commission shall
deny an application for a permit or other authorization under this
chapter that is subject to new source review if the permit or other
authorization is for a permanent cement production plant, including
a cement kiln, that will be located within 10 miles of a
semiconductor wafer manufacturing facility.
SECTION 2. This Act takes effect September 1, 2025.